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High-Frequency Center Probe Test Socket for Devices up to 55mm Square
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High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square
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High-Frequency Center Probe Test Socket w/Adjustable Pressure Pad for Devices up to 27mm Square
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High-Frequency Interposer Socket
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High-Temp (up to 250°C) RF Test Socket with Replaceable Contact Strips
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High-Temp Test & Burn-in Sockets for BGA, LGA, QFN, MLCC, and Bumped Die Devices
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Available in RoHS
High-Temperature (250°C) Universal Zero-Insertion-Force DIP Test Socket – Series X55X
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High-Temperature SOIC-to-DIP Adapter – Series 350000-10-HT
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Horizontal Display DIP Socket with Bifurcated Contacts – Series 800
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Horizontal Mounting DIP Display with Collet Contacts – Series 800 Vertisocket
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Inline Jumpers on 0.100 [2.54] Centers – Series 152, 156, and 157
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Available in RoHS
Insert Plates for Universal PLCC ZIF Test Socket – Series 537
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